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Fausto Fantini:
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Publications of Author
- M. Borgarino, Roberto Menozzi, D. Dieci, L. Cattani, Fausto Fantini
Reliability physics of compound semiconductor transistors for microwave applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:1, pp:21-30 [Journal]
- Fausto Fantini, Massimo Vanzi
Editorial. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:9-11, pp:1249- [Journal]
- V. Lista, P. Garbossa, T. Tomasi, M. Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa
Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:9-11, pp:1389-1392 [Journal]
- J. Kuchenbecker, M. Borgarino, M. Zeuner, U. König, R. Plana, Fausto Fantini
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1719-1723 [Journal]
- G. Cassanelli, Fausto Fantini, G. Serra, S. Sgatti
Reliability in automotive electronics: a case study applied to diesel engine control. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1411-1416 [Journal]
- G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
Reliability predictions in electronic industrial applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1321-1326 [Journal]
- G. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano
Failure Analysis-assisted FMEA. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:9-11, pp:1795-1799 [Journal]
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