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Eddy De Backer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Peter Coppens, Guido Vanhorebeek, Eddy De Backer
    Correlation between predicted cause of SRAM failures and in-line defect data. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:1, pp:53-57 [Journal]
  2. Jan Ackaert, Z. Wang, Eddy De Backer, P. Colson, Peter Coppens
    Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1403-1407 [Journal]
  3. Jan Ackaert, Klara Bessemans, Eddy De Backer
    Charging induced damage by photoconduction through thick inter metal dielectrics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1525-1529 [Journal]

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