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Paul Kurpas: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers
    Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:8, pp:1103-1108 [Journal]

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