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P. Poirier:
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Publications of Author
- Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1539-1544 [Journal]
- B. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps
Comprehensive failure analysis of leakage faults in bipolar transistors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:9-11, pp:1449-1452 [Journal]
- D. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès
Isolating failing sites in IC packages using time domain reflectometry: Case studies. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1639-1644 [Journal]
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