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M. Bafleur: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis
    Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1539-1544 [Journal]
  2. T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles
    Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:3, pp:439-444 [Journal]
  3. D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères
    TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:1, pp:71-79 [Journal]
  4. M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier
    Determination of the ESD Failure Cause Through its Signature. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1551-1556 [Journal]
  5. N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis
    Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1415-1420 [Journal]
  6. F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis
    Application of various optical techniques for ESD defect localization. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1563-1568 [Journal]
  7. C. Lochot, J. P. Lainé, M. Bafleur, A. Cazarré, J. Tasselli
    Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:8, pp:804-811 [Journal]

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