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Publications of Author

1. M. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel
   Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:7, pp:987-990 [Journal]
   
2. Matthias Beichele, Anton J. Bauer, Heiner Ryssel
   Reliability of ultrathin nitrided oxides grown in low pressure N₂O ambient. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:7, pp:1089-1092 [Journal]
   
3. S. Strobel, Anton J. Bauer, Matthias Beichele, Heiner Ryssel
   Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:7, pp:1085-1088 [Journal]
   
4. Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
   Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:8, pp:1253-1257 [Journal]
   
5. Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel
   Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:5-6, pp:819-822 [Journal]
   
6. Albena Paskaleva, Anton J. Bauer, Martin Lemberger
   Conduction mechanisms and an evidence for phonon-assisted conduction process in thin high-k Hf_xTi_ySi_zO films. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:7-8, pp:1124-1133 [Journal]