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L. Tielemans: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel
    High-resolution in-situ of gold electromigration: test time reduction. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1439-1442 [Journal]
  2. L. Tielemans, R. Rongen, Ward De Ceuninck
    How reliable are reliability tests? [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1339-1345 [Journal]

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