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N. Tosic Golo: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. N. Tosic Golo, S. van der Wal, Fred G. Kuper, Ton J. Mouthaan
    The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1391-1396 [Journal]
  2. N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan
    Zapping thin film transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:747-765 [Journal]

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