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Ru Huang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jin He, Xing Zhang, Ru Huang, Yangyuan Wang
    Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:12, pp:1953-1957 [Journal]
  2. Jin He, Xing Zhang, Ru Huang, Yangyuan Wang
    Application of forward gated-diode R-G current method in extracting F-N stress-induced interface traps in SOI NMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:1, pp:145-148 [Journal]
  3. Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang
    Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:5, pp:707-711 [Journal]

  4. The design of energy-saving filtering mechanism for sensor networks. [Citation Graph (, )][DBLP]


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