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K. Azamawari: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. A. Teramoto, H. Umeda, K. Azamawari, K. Kobayashi, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi
    Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:1, pp:47-52 [Journal]

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