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Matthias Beichele: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Matthias Beichele, Anton J. Bauer, Heiner Ryssel
    Reliability of ultrathin nitrided oxides grown in low pressure N2O ambient. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:1089-1092 [Journal]
  2. S. Strobel, Anton J. Bauer, Matthias Beichele, Heiner Ryssel
    Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:1085-1088 [Journal]

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