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X. Blasco: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. M. Porti, X. Blasco, M. Nafría, X. Aymerich, Alexander Olbrich, Bernd Ebersberger
    Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:1041-1044 [Journal]
  2. D. Hill, X. Blasco, M. Porti, M. Nafría, X. Aymerich
    Characterising the surface roughness of AFM grown SiO2 on Si. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:7, pp:1077-1079 [Journal]
  3. X. Blasco, M. Nafría, X. Aymerich
    Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO2 Gate Oxide on MOS Structures. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1513-1516 [Journal]
  4. X. Blasco, M. Nafría, X. Aymerich, J. Pétry, W. Vandervorst
    Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced - CAFM. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:5-6, pp:811-814 [Journal]

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