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M. Nakabayashi:
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Publications of Author
- M. Nakabayashi, H. Ohyama, E. Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara
Reliability of polycrystalline silicon thin film resistors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1341-1346 [Journal]
- H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga
Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:1, pp:79-85 [Journal]
- H. Ohyama, M. Nakabayashi, E. Simoen, C. Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi
Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1443-1448 [Journal]
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