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Wolfgang Wilkening: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Michael Schenkel, Paul Pfäffli, Wolfgang Wilkening, D. Aemmer, Wolfgang Fichtner
    Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:815-822 [Journal]
  2. V. Dubec, Scrgey Bychikhin, M. Blaho, Dionyz Pogany, E. Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini
    A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1557-1561 [Journal]
  3. Heinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening
    Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:2, pp:279-285 [Journal]
  4. Wolfgang Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton
    Test circuits for fast and reliable assessment of CDM robustness of I/O stages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:2, pp:269-277 [Journal]
  5. M. Etherton, N. Qu, J. Willemen, Wolfgang Wilkening, S. Mettler, M. Dissegna, R. Stella, L. Zullino, A. Andreini, Horst A. Gieser
    Study of CDM specific effects for a smart power input protection structure. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:666-676 [Journal]

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