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R. D. Schrimpf: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. D. G. Walker, T. S. Fisher, J. Liu, R. D. Schrimpf
    Thermal modeling of single event burnout failure in semiconductor power devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:4, pp:571-578 [Journal]
  2. P. C. Adell, R. D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, H. J. Barnaby, O. Mion
    Single event transient effects in a voltage reference. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:2, pp:355-359 [Journal]
  3. A. M. Albadri, R. D. Schrimpf, K. F. Galloway, D. G. Walker
    Single event burnout in power diodes: Mechanisms and models. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:2-4, pp:317-325 [Journal]

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