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M. Heyns:
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Publications of Author
- C. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, M. Heyns, O. Van Der Biest
In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:7, pp:995-998 [Journal]
- G. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, M. Heyns, K. De Meyer
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:5-6, pp:794-797 [Journal]
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