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Fuchen Mu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan
    A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:11, pp:1909-1913 [Journal]
  2. Fuchen Mu, Changhua Tan, Mingzhen Xu
    Proportional difference estimate method of determining characteristic parameters of normal and log-normal distributions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:1, pp:129-131 [Journal]
  3. Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan
    Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:6, pp:985-989 [Journal]

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