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Gianluca Boselli: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper
    Investigations on double-diffused MOS transistors under ESD zap conditions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:3, pp:395-405 [Journal]
  2. Jeremy C. Smith, Gianluca Boselli
    A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:2, pp:201-210 [Journal]
  3. Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
    Gate oxide failures due to anomalous stress from HBM ESD testers. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:656-665 [Journal]

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