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M. Stecher:
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Publications of Author
- Harald Gossner, T. Müller-Lynch, K. Esmark, M. Stecher
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:3, pp:385-393 [Journal]
- Scrgey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, E. Gornik, G. Groos, M. Stecher
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1501-1506 [Journal]
- M. Blaho, Dionyz Pogany, E. Gornik, M. Denison, G. Groos, M. Stecher
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:4, pp:545-548 [Journal]
- M. Heer, V. Dubec, M. Blaho, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Denison, M. Stecher, G. Groos
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1688-1693 [Journal]
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