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M. Stecher: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Harald Gossner, T. Müller-Lynch, K. Esmark, M. Stecher
    Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:3, pp:385-393 [Journal]
  2. Scrgey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, E. Gornik, G. Groos, M. Stecher
    Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1501-1506 [Journal]
  3. M. Blaho, Dionyz Pogany, E. Gornik, M. Denison, G. Groos, M. Stecher
    Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:4, pp:545-548 [Journal]
  4. M. Heer, V. Dubec, M. Blaho, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Denison, M. Stecher, G. Groos
    Automated setup for thermal imaging and electrical degradation study of power DMOS devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1688-1693 [Journal]

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