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Fernanda Irrera: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Fernanda Irrera
Electrical degradation and recovery of dielectrics in n++-poly-Si/SiOx/SiO2/p-sub structures designed for application in low-voltage non-volatile memories. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:11, pp:1809-1813 [Journal] - Ruggero Feruglio, Fernanda Irrera, Bruno Riccò
Microscopic aspects of defect generation in SiO2. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1427-1432 [Journal] - Domenico Caputo, Fernanda Irrera
Investigation and modeling of stressed thermal oxides. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:3, pp:327-333 [Journal] - Domenico Caputo, Fernanda Irrera
On the reliability of ZrO2 films for VLSI applications. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2004, v:44, n:5, pp:739-745 [Journal] - Fernanda Irrera, Giuseppina Puzzilli, Domenico Caputo
A comprehensive model for oxide degradation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:5-6, pp:853-856 [Journal] - Fernanda Irrera, Giuseppina Puzzilli
Crested barrier in the tunnel stack of non-volatile memories. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:5-6, pp:907-910 [Journal]
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