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I. Manic: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev
    Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1373-1378 [Journal]
  2. Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, D. Dankovic, S. Golubovic, S. Dimitrijev
    Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1465-1468 [Journal]
  3. Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev
    Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:669-677 [Journal]
  4. S. Djoric-Veljkovic, I. Manic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic
    Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1455-1460 [Journal]
  5. Ninoslav Stojadinovic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, I. Manic, S. Golubovic
    Negative bias temperature instability mechanisms in p-channel power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1343-1348 [Journal]
  6. Ninoslav Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev
    Effects of electrical stressing in power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:1, pp:115-122 [Journal]
  7. D. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic
    NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1828-1833 [Journal]

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