L. Militaru, A. Souifi, M. Mouis, A. Chantre, G. Brémond Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:2, pp:253-263 [Journal]