The SCEAS System
Navigation Menu
Introduction
Collection Based
Clustering
Ranking
Paper Based
Journals
Conferences
DB Status
Statistics
Search

Search the dblp DataBase

Title:
Author:
W. L. Pearn: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. W. L. Pearn, C. H. Ko, K. H. Wang
    A multiprocess performance analysis chart based on the incapability index Cpp: an application to the chip resistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:7, pp:1121-1125 [Journal]
  2. Jann-Pygn Chen, W. L. Pearn
    Testing process performance based on the yield: an application to the liquid-crystal display module. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:8, pp:1235-1241 [Journal]
  3. P. C. Lin, W. L. Pearn
    Testing process capability for one-sided specification limit with application to the voltage level translator. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:12, pp:1975-1983 [Journal]
  4. W. L. Pearn, G. H. Lin
    A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:4, pp:651-664 [Journal]
  5. W. L. Pearn, Ming-Hung Shu
    Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:963-975 [Journal]
  6. W. L. Pearn, Ming-Hung Shu
    Erratum to "An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators" [Microelectronics Reliability 2003;43: 495-502]. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1349- [Journal]
  7. W. L. Pearn, Ming-Hung Shu
    An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:3, pp:495-502 [Journal]
  8. W. L. Pearn, Chien-Wei Wu
    Production quality and yield assurance for processes with multiple independent characteristics. [Citation Graph (0, 0)][DBLP]
    European Journal of Operational Research, 2006, v:173, n:2, pp:637-647 [Journal]
  9. W. L. Pearn, Ya-Chen Hsu
    Optimal tool replacement for processes with low fraction defective. [Citation Graph (0, 0)][DBLP]
    European Journal of Operational Research, 2007, v:180, n:3, pp:1116-1129 [Journal]
  10. W. L. Pearn, Chien-Wei Wu
    A Bayesian approach for assessing process precision based on multiple samples. [Citation Graph (0, 0)][DBLP]
    European Journal of Operational Research, 2005, v:165, n:3, pp:685-695 [Journal]

Search in 0.001secs, Finished in 0.002secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
Introduction Collection Based Clustering Ranking Paper Based Journals Conferences DB Status Statistics Search
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002