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Prasad Chaparala: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Douglas Brisbin, Prasad Chaparala
Influence of test techniques on soft breakdown detection in ultra-thin oxides. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:1, pp:35-39 [Journal] - Barry O'Connell, Prasad Chaparala, Bhola Mehrotra
Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2004, v:44, n:8, pp:1263-1268 [Journal] - M. M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala
Influence of mobility model on extraction of stress dependent source-drain series resistance. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2004, v:44, n:1, pp:25-32 [Journal] - Douglas Brisbin, Andy Strachan, Prasad Chaparala
Optimizing the hot carrier reliability of N-LDMOS transistor arrays. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:7-8, pp:1021-1032 [Journal] - Prasad Chaparala, Douglas Brisbin
Impact of NBTI and HCI on PMOSFET threshold voltage drift. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:1, pp:13-18 [Journal]
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