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D. M. Fleetwood: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. D. M. Fleetwood
    Hydrogen-related reliability issues for advanced microelectronics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1397-1403 [Journal]
  2. D. M. Fleetwood
    Effects of hydrogen transport and reactions on microelectronics radiation response and reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:523-541 [Journal]
  3. J. A. Felix, J. R. Schwank, D. M. Fleetwood, M. R. Shaneyfelt, E. P. Gusev
    Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:4, pp:563-575 [Journal]

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