Search the dblp DataBase
Rolf-Peter Vollertsen: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai
A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:3, pp:335-341 [Journal] - Rolf-Peter Vollertsen
Fast wafer level reliability: methods and experiences. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2004, v:44, n:8, pp:1207-1208 [Journal] - Andreas Martin, Rolf-Peter Vollertsen
An introduction to fast wafer level reliability monitoring for integrated circuit mass production. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2004, v:44, n:8, pp:1209-1231 [Journal] - Rainer Duschl, Rolf-Peter Vollertsen
Is the power-law model applicable beyond the direct tunneling regime? [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:12, pp:1861-1867 [Journal] - Rolf-Peter Vollertsen, Enrique Miranda
The TDDB power-law model - Physics and experimental evidences. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:12, pp:1807-1808 [Journal]
Search in 0.001secs, Finished in 0.001secs
| NOTICE1 |
|---|
| System may not be available sometimes or not working properly, since it is still in development with continuous upgrades |
| NOTICE2 |
|---|
| The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP |
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002