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D. Faure: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled
Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1723-1727 [Journal] - D. Faure, C. A. Waggoner
A New sub-micro probing technique for failure analysis in integrated circuits. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1767-1770 [Journal] - D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen
Gate oxide breakdown characterization on 0.13mum CMOS technology. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1519-1523 [Journal] - F. Sibileau, C. Ali, C. Giret, D. Faure
SRAM cell defect isolation methodology by sub micron probing technique. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1562-1567 [Journal]
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