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J. Wyss: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Kaminksy
    The Reliability of New Generation Power MOSFETs in Radiation Environment. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1629-1634 [Journal]
  2. F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Candelori
    Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact, . [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:4, pp:549-555 [Journal]
  3. F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Sanseverino, A. Candelori, G. Currò, A. Cascio, F. Frisina
    Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1847-1851 [Journal]

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