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Roger Cline: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Craig Salling, Jerry Hu, Jeff Wu, Charvaka Duvvury, Roger Cline, Rith Pok
    Development of substrate-pumped nMOS protection for a 0.13 mum technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:6, pp:887-899 [Journal]
  2. Jorge Salcedo-Suñer, Charvaka Duvvury, Roger Cline, Alfonso Cadena-Hernandez
    Latchup in voltage tolerant circuits: a new phenomenon. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:4, pp:549-562 [Journal]
  3. Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
    Gate oxide failures due to anomalous stress from HBM ESD testers. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:656-665 [Journal]

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