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F. J. García Sánchez: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, F. J. García Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, C. S. Ho
    Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:343-347 [Journal]
  2. Adelmo Ortiz-Conde, F. J. García Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
    A review of recent MOSFET threshold voltage extraction methods. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:583-596 [Journal]
  3. F. J. García Sánchez, Adelmo Ortiz-Conde, J. Muci
    Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:731-742 [Journal]

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