|
Search the dblp DataBase
D. Flores:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- J. Roig, D. Flores, M. Vellvehí, J. Rebollo, J. Millán
Reduction of self-heating effect on SOIM devices. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:1, pp:61-66 [Journal]
- S. Hidalgo, D. Flores, I. Obieta, I. Mazarredo
Passivation and packaging of positive bevelled edge termination and related electrical stability. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:3, pp:413-420 [Journal]
- I. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo
Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:3-4, pp:493-498 [Journal]
- J. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo
Lateral punch-through TVS devices for on-chip protection in low-voltage applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:7-8, pp:1181-1186 [Journal]
- J. Roig, D. Flores, S. Hidalgo, J. Rebollo, J. Millán
Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2004, v:35, n:3, pp:291-297 [Journal]
- M. Vellvehí, D. Flores, X. Jordà, S. Hidalgo, J. Rebollo, L. Coulbeck, P. Waind
Design considerations for 6.5 kV IGBT devices. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2004, v:35, n:3, pp:269-275 [Journal]
- J. Urresti, S. Hidalgo, D. Flores, J. Roig, J. Rebollo, I. Mazarredo
Optimisation of very low voltage TVS protection devices. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2003, v:34, n:9, pp:809-813 [Journal]
Search in 0.001secs, Finished in 0.002secs
|