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J. L. Goudard: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- J. L. Goudard, P. Berthier, X. Boddaert, D. Laffitte, J. Périnet
New qualification approach for optoelectronic components. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1307-1310 [Journal] - L. Mendizabal, J. L. Verneuil, L. Béchou, C. Aupetit-Berthelemot, Y. Deshayes, F. Verdier, J. M. Dumas, Y. Danto, D. Laffitte, J. L. Goudard
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1743-1749 [Journal] - J. L. Goudard, X. Boddaert, J. Périnet, D. Laffitte
Reliability of optoelectronics components: towards new qualification practices. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1767-1769 [Journal] - Y. Deshayes, L. Béchou, J.-Y. Delétage, F. Verdier, Y. Danto, D. Laffitte, J. L. Goudard
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:7, pp:1125-1136 [Journal] - S. Huyghe, L. Béchou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J. L. Goudard, Y. Danto
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1593-1599 [Journal]
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