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A. Dehbi:
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- A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:6, pp:835-840 [Journal]
- A. Dehbi, Y. Ousten, Y. Danto, W. Wondrak
Vibration lifetime modelling of PCB assemblies using steinberg model. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1658-1661 [Journal]
- H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi
Failure mechanisms and qualification testing of passive components. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1626-1632 [Journal]
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