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W. Wondrak: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto
    High temperature reliability testing of aluminum and tantalum electrolytic capacitors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:6, pp:835-840 [Journal]
  2. A. Dehbi, Y. Ousten, Y. Danto, W. Wondrak
    Vibration lifetime modelling of PCB assemblies using steinberg model. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1658-1661 [Journal]
  3. M. Wagner, W. Unger, W. Wondrak
    Part average analysis - A tool for reducing failure rates in automotive electronics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1433-1438 [Journal]

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