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L. Zullino:
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Publications of Author
- M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, E. Gornik
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:9-11, pp:1281-1286 [Journal]
- V. Dubec, Scrgey Bychikhin, M. Blaho, Dionyz Pogany, E. Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1557-1561 [Journal]
- M. Etherton, N. Qu, J. Willemen, Wolfgang Wilkening, S. Mettler, M. Dissegna, R. Stella, L. Zullino, A. Andreini, Horst A. Gieser
Study of CDM specific effects for a smart power input protection structure. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:5-6, pp:666-676 [Journal]
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