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R. Kraus: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Alessandro Castellazzi, R. Kraus, N. Seliger, Doris Schmitt-Landsiedel
    Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1605-1610 [Journal]
  2. Alessandro Castellazzi, V. Kartal, R. Kraus, N. Seliger, M. Honsberg-Riedl, Doris Schmitt-Landsiedel
    Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1877-1882 [Journal]

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