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N. Seliger: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Alessandro Castellazzi, R. Kraus, N. Seliger, Doris Schmitt-Landsiedel
Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1605-1610 [Journal] - N. Seliger, E. Wolfgang, G. Lefranc, H. Berg, T. Licht
Reliable power electronics for automotive applications. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1597-1604 [Journal] - W. Kanert, H. Dettmer, B. Plikat, N. Seliger
Reliability aspects of semiconductor devices in high temperature applications. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1839-1846 [Journal] - G. Coquery, G. Lefranc, T. Licht, R. Lallemand, N. Seliger, H. Berg
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1871-1876 [Journal] - Alessandro Castellazzi, V. Kartal, R. Kraus, N. Seliger, M. Honsberg-Riedl, Doris Schmitt-Landsiedel
Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1877-1882 [Journal]
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