The SCEAS System
Navigation Menu

Search the dblp DataBase


M. Natarajan Iyer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Bart Keppens, V. De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken
    Significance of the failure criterion on transmission line pulse testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:6, pp:901-907 [Journal]
  2. Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, S. Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes
    High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:7, pp:1011-1020 [Journal]
  3. S. Thijs, M. Natarajan Iyer, D. Linten, W. Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, S. Decoutere, Guido Groeseneken
    Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:702-712 [Journal]

Search in 0.001secs, Finished in 0.001secs
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
System created by [] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002