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M. Natarajan Iyer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Bart Keppens, V. De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken
    Significance of the failure criterion on transmission line pulse testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:6, pp:901-907 [Journal]
  2. Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, S. Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes
    High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:7, pp:1011-1020 [Journal]
  3. S. Thijs, M. Natarajan Iyer, D. Linten, W. Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, S. Decoutere, Guido Groeseneken
    Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:702-712 [Journal]

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