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Masayasu Ishiko: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Masanori Usui, Takahide Sugiyama, Masayasu Ishiko, Jun Morimoto, Hirokazu Saitoh, Masaki Ajioka
    Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1647-1652 [Journal]
  2. Masanori Usui, Masayasu Ishiko, Koji Hotta, Satoshi Kuwano, Masato Hashimoto
    Effects of uni-axial mechanical stress on IGBT characteristics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1682-1687 [Journal]
  3. Masayasu Ishiko, Masanori Usui, Takashi Ohuchi, Mikio Shirai
    Design concept for wire-bonding reliability improvement by optimizing position in power devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:3, pp:262-268 [Journal]

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