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R. V. Joshi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. R. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, C. T. Chuang, R. V. Joshi, G. Northrop, K. Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo
    Analysis of the effect of the gate oxide breakdown on SRAM stability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1445-1448 [Journal]
  2. R. Rodríguez, James H. Stathis, Barry P. Linder, R. V. Joshi, C. T. Chuang
    Influence and model of gate oxide breakdown on CMOS inverters. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1439-1444 [Journal]

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