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Stéphane Grauby:
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Publications of Author
- Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1609-1613 [Journal]
- G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1803-1807 [Journal]
- Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby
Applications of temperature phase measurements to IC testing. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2004, v:44, n:1, pp:95-103 [Journal]
- Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire
ElectroStatic Discharge Fault Localization by Laser Probing. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1482-1486 [Journal]
- J. M. Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire
Time gating imaging through thick silicon substrate: a new step towards backside characterisation. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:9-11, pp:1520-1524 [Journal]
- Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2004, v:35, n:10, pp:811-816 [Journal]
- Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2004, v:35, n:10, pp:797-803 [Journal]
- Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys
Strain energy imaging of a power MOS transistor using speckle interferometry. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:2, pp:293-296 [Journal]
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