|
Search the dblp DataBase
Daniel Yap:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- Tong Yan Tee, Hun Shen Ng, Daniel Yap, Xavier Baraton, Zhaowei Zhong
Board level solder joint reliability modeling and testing of TFBGA packages for telecommunication applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:7, pp:1117-1123 [Journal]
- Tong Yan Tee, Chek Lim Kho, Daniel Yap, Carol Toh, Xavier Baraton, Zhaowei Zhong
Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:5, pp:741-749 [Journal]
- Tong Yan Tee, Hun Shen Ng, Daniel Yap, Zhaowei Zhong
Comprehensive board-level solder joint reliability modeling and testing of QFN and PowerQFN packages. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:8, pp:1329-1338 [Journal]
Search in 0.001secs, Finished in 0.001secs
|