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Daniel Yap: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Tong Yan Tee, Hun Shen Ng, Daniel Yap, Xavier Baraton, Zhaowei Zhong
    Board level solder joint reliability modeling and testing of TFBGA packages for telecommunication applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:7, pp:1117-1123 [Journal]
  2. Tong Yan Tee, Chek Lim Kho, Daniel Yap, Carol Toh, Xavier Baraton, Zhaowei Zhong
    Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:5, pp:741-749 [Journal]
  3. Tong Yan Tee, Hun Shen Ng, Daniel Yap, Zhaowei Zhong
    Comprehensive board-level solder joint reliability modeling and testing of QFN and PowerQFN packages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1329-1338 [Journal]

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