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S. Blonkowski: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. F. Mondon, S. Blonkowski
    Electrical characterisation and reliability of HfO2 and Al2O3-HfO2 MIM capacitors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1259-1266 [Journal]
  2. C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent
    MIM capacitance variation under electrical stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1237-1240 [Journal]
  3. E. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer
    Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:5-6, pp:925-928 [Journal]

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