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S. Blonkowski :
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F. Mondon , S. Blonkowski Electrical characterisation and reliability of HfO2 and Al2 O3 -HfO2 MIM capacitors. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2003, v:43, n:8, pp:1259-1266 [Journal ] C. Besset , S. Bruyère , S. Blonkowski , S. Crémer , E. Vincent MIM capacitance variation under electrical stress. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2003, v:43, n:8, pp:1237-1240 [Journal ] E. Deloffre , L. Montès , G. Ghibaudo , S. Bruyère , S. Blonkowski , S. Bécu , M. Gros-Jean , S. Crémer Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2005, v:45, n:5-6, pp:925-928 [Journal ] Search in 0.002secs, Finished in 0.002secs