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Kirsten Weide-Zaage:
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- David Dalleau, Kirsten Weide-Zaage, Yves Danto
Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1821-1826 [Journal]
- Kirsten Weide-Zaage, Walter Horaud, Hélène Frémont
Moisture diffusion in Printed Circuit Boards: Measurements and Finite- Element- Simulations. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1662-1667 [Journal]
- Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont
Dynamic void formation in a DD-copper-structure with different metallization geometry. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2007, v:47, n:2-3, pp:319-325 [Journal]
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