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Yves Danto: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. David Dalleau, Kirsten Weide-Zaage, Yves Danto
    Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1821-1826 [Journal]
  2. Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont
    Dynamic void formation in a DD-copper-structure with different metallization geometry. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2007, v:47, n:2-3, pp:319-325 [Journal]

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