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Wei-Ting Kary Chien: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai
    Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:5, pp:713-724 [Journal]
  2. Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai
    Some practical considerations for effective and efficient wafer-level reliability control. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1233-1243 [Journal]
  3. Wei-Ting Kary Chien, S. F. Yang
    A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2007, v:56, n:1, pp:69-76 [Journal]

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