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G. Currò:
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Publications of Author
- F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Sanseverino, A. Candelori, G. Currò, A. Cascio, F. Frisina
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1847-1851 [Journal]
- G. Busatto, A. Porzio, F. Velardi, F. Iannuzzo, A. Sanseverino, G. Currò
Experimental and Numerical investigation about SEB/SEGR of Power MOSFET. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1711-1716 [Journal]
- G. Busatto, F. Iannuzzo, A. Porzio, A. Sanseverino, F. Velardi, G. Currò
Experimental study of power MOSFET's gate damage in radiation environment. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:9-11, pp:1854-1857 [Journal]
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