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N. H. Yeung:
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Publications of Author
- C. W. Tan, Y. C. Chan, N. H. Yeung
Behaviour of anisotropic conductive joints under mechanical loading. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:3, pp:481-486 [Journal]
- C. W. Tan, Y. C. Chan, N. H. Yeung
Effect of autoclave test on anisotropic conductive joints. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:2, pp:279-285 [Journal]
- N. H. Yeung, Victor Lau, Y. C. Chan
Bias-HAST on tape ball grid array (TBGA) test pattern. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2004, v:44, n:4, pp:595-602 [Journal]
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