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V. Papez: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. V. Papez, B. Kojecký, J. Kozísek, J. Hejhal
    Transient effects on high voltage diode stack under reverse bias. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:4, pp:557-564 [Journal]
  2. B. Kojecký, V. Papez, D. Sámal
    Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:3, pp:269-274 [Journal]
  3. V. Benda, M. Cernik, V. Papez
    OCVD carrier lifetime in P+NN+ diode structures with axial carrier lifetime gradient. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:3, pp:217-222 [Journal]

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