S. Azzopardi, E. Woirgard, J.-M. Vinassa, O. Briat, C. Zardini IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power? [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1901-1906 [Journal]